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Friday, November 20, 2020 | History

4 edition of Carrier-density-wave depth profilometric measurements in semiconductor Si wafers using laser infrared photothermal radiometry found in the catalog.

Carrier-density-wave depth profilometric measurements in semiconductor Si wafers using laser infrared photothermal radiometry

Derrick Shaughnessy

Carrier-density-wave depth profilometric measurements in semiconductor Si wafers using laser infrared photothermal radiometry

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  • 30 Currently reading

Published by National Library of Canada in Ottawa .
Written in English


Edition Notes

Thesis (M.A.Sc.) -- University of Toronto, 2002.

SeriesCanadian theses = -- Th`eses canadiennes
The Physical Object
FormatMicroform
Pagination2 microfiches : negative.
ID Numbers
Open LibraryOL21790203M
ISBN 100612687791
OCLC/WorldCa54414849


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Carrier-density-wave depth profilometric measurements in semiconductor Si wafers using laser infrared photothermal radiometry by Derrick Shaughnessy Download PDF EPUB FB2